Characterization of self-heating in cryogenic high electron mobility transistors using Schottky thermometry
نویسندگان
چکیده
Cryogenic low noise amplifiers based on high electron mobility transistors (HEMTs) are widely used in applications such as radio astronomy, deep space communications, and quantum computing, the physical mechanisms governing microwave figure therefore of practical interest. In particular, contribution thermal from gate at cryogenic temperatures remains unclear owing to a lack experimental measurements resistance under these conditions. Here, we report junction temperature HEMT room using Schottky thermometry method. At $\sim 20$ K, observe nonlinear trend versus power that is consistent with heat dissipation by phonon radiation. Based this finding, consider transport radiation low-noise bias liquid helium estimate several times larger than previously assumed self-heating. We conclude without improvements management, self-heating results lower limit for HEMTs temperatures.
منابع مشابه
Cryogenic Ultra-Low Noise InP High Electron Mobility Transistors
iii List of publications v Notations and abbreviations vii
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ژورنال
عنوان ژورنال: Journal of Applied Physics
سال: 2021
ISSN: ['1089-7550', '0021-8979', '1520-8850']
DOI: https://doi.org/10.1063/5.0063331